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1 article(s) from Tung, Ryan C.

Scanning speed phenomenon in contact-resonance atomic force microscopy

Christopher C. Glover,
Jason P. Killgore and
Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

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Figure 1: Hydrodynamic lubrication phenomenon. (a) The AFM tip is in intimate contact with the sample surface...

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Figure 2: (a) Schematic of the CR system under analysis. The total length of the beam L_B = L₁ + L′ is compris...

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Figure 3: The measured in-contact resonance frequency of the second mode of an AFM cantilever as a function o...

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Figure 4: Measured normalized sample contact stiffness as a function of the scan speed. The red data indicate...

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Figure 5: Measurement error introduced by the scan speed phenomenon. Black circles and red crosses represent ...

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Figure 6: The measured in-contact resonance frequencies of an AFM cantilever as functions of the dynamic scan...

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Figure 7: Average measured adhesion force on mica and HOPG samples at various values of relative humidity. Th...

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Published 21 Mar 2018

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